Empowering semiconductor companies to improve parametric yield and performance with sophisticated variability characterization silicon-IP and modeling tools

Stratosphere Solutions Inc. is a leading provider of innovative parametric yield & performance improvement solution. The solution comprises of a silicon-proven IP tool suite and modeling software tools that enable customers to characterize, model, and analyze impact of variability on parametric yield and performance.

Our tools are built on a "solutions" approach to optimizing parametric yield and performance; an approach that connects manufacturing and design, empowers internal engineering experts and leverages existing equipment and design tool infrastructure. Our tools are used to accurately characterize process variations, extract the necessary process intelligence to optimize process parametric yields, model variations such that they are design flow relevant, and finally integrate these sophisticated models in the design flow.

Stratosphere Solutions' products are used by fab and chip design companies alike,utilizing processes from 130nm down to 32nm, building analog and digital SoC products. Our rapidly growing customer base includes worldwide leading semiconductor foundry, IDM and fab-lite customers.

We invite you to enquire more today about how Stratosphere Solutions can help you to increase parametric yield and improve performance while leveraging your internal expertise and existing infrastructure.

Renesas Technology Adopts Stratosphere Solutions' StratoPro-STX™ Variability Characterization Platform for 45nm click here  

Keithley Partners with Stratosphere Solutions to Enable Advanced Process Characterization at Sub-65nm click here  

Stratosphere and Cadence Collaborate to Drive 45 Nanometer Design Yield and Performance Higher click here