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Nanette Collins,
(617) 437-1822, nanette@nvc.com
Keithley Partners
with Stratosphere Solutions to Enable Advanced Process Characterization
at Sub-65nm click
here
Stone Pillar Technologies
Joins Stratosphere Solutions' ICTrust Partner Program
click here
Stratosphere and
Cadence Collaborate to Drive 45 Nanometer Design Yield and
Performance Higher click
here
Stratosphere Solutions'
StratoPro Earns DesignVision Award click
here
Jan. 02, 2008 - SCD Source - Ten 2008 Trends:
As 45nm hits production, DFM challenges rise - click
here
Nov. 01, 2007 - Solid State Technology
- Improving yield through parametric variability characterization
and modeling - click
here
Sept. 11, 2007 - EDA Design Line - Process
Intelligent Modeling & SSTA Improve DFM - click
here
Sept. 10, 2007 - CDNusers.org - Making
Reliable Models for SSTA - click
here
May 21, 2007 - EDA Weekly - DAC & DFM:
Once More with Feeling - click
here
March 2007 - Chip Design - [Nevertheless]
The Imperative for a Yield-Modeling Ecosystem - click
here
March 8, 2007 - EDN - What my Dad Taught
me about Yield - click
here
January 30, 2007 - IEC DesignVision - StratoPro
Earns Award in Semiconductor IP Category - click
here
January 11, 2007 - Electronic Design -
Dealing with Shades of Gray - click
here
January 11, 2007 - Electronic Design -
DFM Remains the Elephant in the Room - click
here
January 11, 2007 - IEC Announces 2007 DesignVision
Finalists Recognizing Best Tools and Products in Semiconductor
Industry - click
here
January 2, 2007 - EETimes: EDA '07 forecast:
strong, but watch the bumps - click
here
October 1, 2006 - Test & Measurement
World: DFM, DFY get EDA industry emphasis - click
here
September, 2006 - FSA Forum: Managing the
Task of Sub-100nm Process and Design Yield Ramp - click
here
August 18, 2006 - EDA Design Line: The
Sub-100nm Imperative: Parametric Yield Ramp - click
here
July 21, 2006 - Electronic News: Redefining
Success in EDA - click
here
July 17, 2006 - EDA Cafe Weekly: The Business
of DFM - click
here
May 1, 2006 - iDesign: Design-Centric Process
Characterization - click
here
April 17, 2006 - EETimes: Soothing balm
for bleeding edge litho - click
here
April 11, 2006 - Chip Design Magazine:
Max's Chips & Dips - click
here
April 3, 2006 - Test & Measurement
World: Stratosphere Solutions takes flight- click
here
April 3, 2006 - EETimes: Startup enables
IC variability characterization - click
here
March 28, 2006 - Electronic Design: The
Process Intelligence Gap - click
here
StratoPro™ and Ozone™ are trademarks
of Stratosphere Solutions Inc. Stratosphere Solutions
acknowledges trademarks or registered trademarks of other
organizations for their respective products and services.
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